- General course information
- Course code:SEM10117
- Course title: SEMICONDUCTOR MATERIAL ANALYSIS TECHNIQUES
- Course title in English: SEMICONDUCTOR MATERIAL ANALYSIS TECHNIQUES
- Credits: 3
- Course structure:
- Lecture hours: 30
- Practical hours: 30
- Tutorial hours: 0
- Other (self-study hours): 90
- Knowledge block: Specialisation
- Prerequisites: None
- Prior courses: None
- Brief course description:
This course provides specialised knowledge of the interaction of electrons and photons with matter and of the signals emitted from a sample that are used in analytical methods. Students learn the construction, operating principle and application of each specific method for determining sample properties: UV-VIS for absorption, transmission, reflection and band gap of semiconductors; PL for band structure and impurity levels in nanomaterials; STM and AFM for surface properties and quantum arrangement; SEM and TEM for morphology and impurity composition; XRD for crystallinity; the Hall method for conductivity, carrier concentration and mobility in semiconductors; and XPS for bonding and impurity composition. The course also familiarises students with specialist English terminology, with reading international papers, and with group formation, teamwork, presentation, discussion and effective critical thinking, building a firm foundation for genuine research in their graduation thesis.